
Dataray光束質量分析,光斑分析,M2光束分析系統(tǒng)
美國 DataRay 公司提供激光光束分析儀器,對激光光束的光斑大小,形狀和能量分布等參數(shù)進行全面的測試和分析;同時與個人電腦連接對分析的結果提供二維或三維的顯示,并對分析的結果進行打印輸出。適合各種各樣的激光光束,幫助你對你的激光光束的品質提供一個量化的結果。
產(chǎn)品分為:
相機式光束質量分析儀(CCD式) Beam Profiling Cameras
狹縫掃描式光束質量分析儀 Slit Scan Beam Profilers
查看Dataray光束質量分析儀的選擇向導
相機式光束質量分析儀(CCD式)
Beam Profiling Cameras
WinCamD系列

WinCamD-UCD12 |

WinCamD-UCD15 |

WinCamD-UCD23 |

WinCamD-UHR |

WinCamD-XHR |

WinCamD-FIR-HR |

WinCamD-LCM |
BladeCam-HR和BladeCam-XHR系列

BladeCam-XHR
System-BladeCam-XHR
|

BladeCam-XHR-1310
System-BladeCam-XHR-1310
|

BladeCam-XHR-UV
System-BladeCam-XHR-UV
|
 BladeCam-XHR
System-BladeCam-XHR |
 BladeCam-XHR-1310
System-BladeCam-XHR-1310 |
 BladeCam-XHR-UV
System-BladeCam-XHR-UV |
TaperCamD-UCD12和TaperCamD20-15-UCD23系列

TaperCamD-UCD12
System-TaperCamD-UCD12
|

TaperCamD-UCD12-1310
System-TaperCamD-UCD12-1310
|

TaperCamD-UCD12-NIR
System-TaperCamD-UCD12-NIR
|
 TaperCamD20-15-UCD23
System-TaperCamD20-15-UCD23
|
 TaperCamD20-15-UCD23-1310
System-TaperCamD20-15-UCD23-1310
|
 TaperCamD20-15-UCD23-NIR
System-TaperCamD20-15-UCD23-NIR
|
相機式光束質量分析儀附件

Filters/Samplers/Attenuators |

Lenses/Optics |

Translation Stages/Hardware |

UV/IR Converters |

Replacement Detectors |

Replacement Cables |

Manuals |
狹縫掃描式光束質量分析儀
Slit Scan Beam Profilers
Beam'R2系列

Beam'R2-S
System-BR2-Si
|

Beam'R2-InGaAs
System-BR2-IGA
|

Beam'R2-DD Si/InGaAs (190-1750 nm)
System-BR2-DD
|

Beam'R2-DD Si/InGaAs (190-2300 nm)
System-BR2-DD-2300
|

Beam'R2-DD Si/InGaAs (190-2500 nm)
System-BR2-DD-2500
|
BeamMap2 4XY/3XYKE系列

BeamMap2-4XY-Si
System-BMS2-4XY-Si
|

BeamMap2-4XY-InGaAs
System-BMS2-4XY-IGA
|

BeamMap2-4XY-DD Si/InGaAs
System-BMS2-4XY-DD
|

BeamMap2-3XYKE-Si
System-BMS2-3XYKE-Si
|

BeamMap2-3XYKE-InGaAs
System-BMS2-3XYKE-IGA
|

BeamMap2-3XYKE-DD Si/InGaAs
System-BMS2-3XYKE-DD
|
BeamMap2 ColliMate系列

BeamMap2-CM4-Si System-BMS2-CM4-Si
|

BeamMap2-CM4-InGaAs>
System-BMS2-CM4-IGA
|

BeamMap2-CM4-DD Si/InGaAs
System-BMS2-CM4-DD
|

BeamMap2-CM3-Si
System-BMS2-CM3-Si
|

BeamMap2-CM3-InGaAs
System-BMS2-CM3-IGA
|

BeamMap2-CM3-DD Si/InGaAs
System-BMS2-CM3-DD
|
BeamScope-P8 系列

BeamScope-P8-Si
System-BSC-P8-Si
|

BeamScope-P8-Ge
System-BSC-P8-Ge
|

BeamScope-P8-InAs
System-BSC-P8-IA
|

BeamScope-P8-Si, extended probe head
System-BSC-P8-Si-EPH
|

BeamScope-P8-Ge, extended probe head
System-BSC-P8-Ge-EPH
|

BeamScope-P8-InAs, extended probe head
System-BSC-P8-IA-EPH
|
狹縫掃描式光束質量分析儀附件

Samplers/Attenuators |

Lenses/Optics> |

Translation Stages/Hardware |

BeamScope Slits/Pinholes |

True2D Sapphire Slits |

Replacement Cables |

Manuals |
|